Combined soft and hard X-ray ambient pressure photoelectron spectroscopy studies of semiconductor/electrolyte interfaces

Published 2017 View Full Article

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Title
Combined soft and hard X-ray ambient pressure photoelectron spectroscopy studies of semiconductor/electrolyte interfaces
Authors
Keywords
Ambient pressure, Photoelectron spectroscopy, Solid liquid interface, HAXPES
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 221, Issue -, Pages 106-115
Publisher
Elsevier BV
Online
2017-05-19
DOI
10.1016/j.elspec.2017.05.003

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