X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions

Published 2017 View Full Article

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Title
X-ray photoelectron spectroscopy study of highly-doped ZnO:Al,N films grown at O-rich conditions
Authors
Keywords
ZnO films, Nitrogen-aluminum doping, XRD, X-ray photoelectron spectroscopy
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 722, Issue -, Pages 683-689
Publisher
Elsevier BV
Online
2017-06-16
DOI
10.1016/j.jallcom.2017.06.169

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