Annealing temperature effects on Bi 6 Fe 2 Ti 3 O 18 /LaNiO 3 /Si thin films by an all-solution approach

Authors

Keywords

Bi, 6, Fe, 2, Ti, 3, O, 18, Thin films, All-solution route, Multiferroic

Journal

Volume 694, Issue -, Pages 489-496

Publisher

Elsevier BV

Online

2016-10-09

DOI

10.1016/j.jallcom.2016.10.011

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