Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground

Title
Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground
Authors
Keywords
-
Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 56, Issue 8, Pages 0802A5
Publisher
Japan Society of Applied Physics
Online
2017-06-30
DOI
10.7567/jjap.56.0802a5

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started