Probing the thickness and roughness of the functional layer in thin film composite membranes

Title
Probing the thickness and roughness of the functional layer in thin film composite membranes
Authors
Keywords
Thin film composite membrane, Thickness characterization, Polyamide film, Atomic force microscopy, Profilometer, FEG-SEM
Journal
INTERNATIONAL JOURNAL OF HYDROGEN ENERGY
Volume 42, Issue 42, Pages 26464-26474
Publisher
Elsevier BV
Online
2017-08-09
DOI
10.1016/j.ijhydene.2017.07.145

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