Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness

Published 2017 View Full Article

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Title
Power-Rail ESD Clamp Circuit with Parasitic-BJT and Channel Parallel Shunt Paths to Achieve Enhanced Robustness
Authors
Keywords
-
Journal
IEICE TRANSACTIONS ON ELECTRONICS
Volume E100.C, Issue 3, Pages 344-347
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Online
2017-03-01
DOI
10.1587/transele.e100.c.344

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