Exploration of selector characteristic based on electron tunneling for RRAM array application

Published 2017 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Exploration of selector characteristic based on electron tunneling for RRAM array application
Authors
Keywords
-
Journal
IEICE Electronics Express
Volume 14, Issue 17, Pages 20170739-20170739
Publisher
Institute of Electronics, Information and Communications Engineers (IEICE)
Online
2017-08-17
DOI
10.1587/elex.14.20170739

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.