4.5 Article

Area and Energy-Efficient Complementary Dual-Modular Redundancy Dynamic Memory for Space Applications

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TVLSI.2016.2603923

Keywords

Embedded dynamic random access memory (eDRAM); gain cell; low power; radiation hardening; single event upset (SEU); soft errors; space applications; static RAM (SRAM)

Funding

  1. HiPer Consortium under Magnet program of the office of the chief scientist in the Israeli Ministry of Economy

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The limited size and power budgets of space-bound systems often contradict the requirements for reliable circuit operation within high-radiation environments. In this paper, we propose the smallest solution for soft-error tolerant embedded memory yet to be presented. The proposed complementary dual-modular redundancy (CDMR) memory is based on a four-transistor dynamic memory core that internally stores complementary data values to provide an inherent per-bit error detection capability. By adding simple, low-overhead parity, an error-correction capability is added to the memory architecture for robust soft-error protection. The proposed memory was implemented in a 65-nm CMOS technology, displaying as much as a 3.5x smaller silicon footprint than other radiation-hardened bitcells. In addition, the CDMR memory consumes between 48% and 87% less standby power than other considered solutions across the entire operating region.

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