Discriminative Deep Metric Learning for Face and Kinship Verification

Published 2017 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Discriminative Deep Metric Learning for Face and Kinship Verification
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON IMAGE PROCESSING
Volume 26, Issue 9, Pages 4269-4282
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-06-21
DOI
10.1109/tip.2017.2717505

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.