4.6 Article

The Avalanche-Mode Superjunction LED

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 64, Issue 4, Pages 1612-1618

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2017.2669645

Keywords

Avalanche breakdown; electroluminescence (EL); internal quantum efficiency (IQE); light emitting diode (LED); photodiode (PD); reduced surface field (RESURF); silicon

Funding

  1. Dutch Technology Foundation STW, an applied science division of NWO

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Avalanche-mode light-emitting diodes (AMLEDs) in silicon (Si) are potential light sources to enable monolithic optical links in standard CMOS technology, due to the large overlap of their electroluminescent (EL) spectra with the responsivity of Si photodiodes. These EL spectra depend on the reverse electric field. We present AMLEDs employing the superjunction (SJ) assisted reduced surface field (RESURF) effect, which increases the uniformity of their electric field profile. Consequently, the EL area of these lateral devices is significantly enlarged as compared with conventional AMLEDs. Electrical and optical measurements demonstrate RESURF, as predicted by TCAD simulations, and show a direct link between EL-intensity (optical power per unit device area) and the field profile. Contrary to a conventional AMLED, the breakdown voltage of the avalanche-mode SJ-LED scales with the device length. Furthermore, the brightest SJ-LED, with a lateral intensity of similar to 30 mW cm(-2) at an electrical power (P-AMLED) of 0.1 W, shows a twofold higher internal quantum efficiency and a threefold higher EL-intensity compared with the conventional AMLED for the same P-AMLED. This particular SJ-LED also shows an optimum radiative recombination efficiency at a current density of around similar to 800 A cm(-2).

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