Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs

Title
Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 64, Issue 2, Pages 521-526
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-01-06
DOI
10.1109/ted.2016.2641586

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