Deep Metric Learning for Visual Understanding: An Overview of Recent Advances

Title
Deep Metric Learning for Visual Understanding: An Overview of Recent Advances
Authors
Keywords
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Journal
IEEE SIGNAL PROCESSING MAGAZINE
Volume 34, Issue 6, Pages 76-84
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-11-10
DOI
10.1109/msp.2017.2732900

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