Investigations of the structural, morphological and electrical properties of multilayer ZnO/TiO 2 thin films, deposited by sol–gel technique

Published 2016 View Full Article

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Title
Investigations of the structural, morphological and electrical properties of multilayer ZnO/TiO 2 thin films, deposited by sol–gel technique
Authors
Keywords
Semiconductors, Sol–gel, XRD, SEM, Four point probe
Journal
Results in Physics
Volume 6, Issue -, Pages 156-160
Publisher
Elsevier BV
Online
2016-01-30
DOI
10.1016/j.rinp.2016.01.015

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