An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures

Title
An advanced three-dimensional RHEED mapping approach to the diffraction study of Co/MnF2/CaF2/Si(001) epitaxial heterostructures
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 49, Issue 5, Pages 1532-1543
Publisher
International Union of Crystallography (IUCr)
Online
2016-08-24
DOI
10.1107/s1600576716011407

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