Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 49, Issue -, Pages 632-635Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600576716003204
Keywords
microstrain distribution; X-ray microdiffraction; polycrystalline thin films
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Funding
- Helmholtz Virtual Institute 'Microstructure Control in Thin-Film Solar Cells' [VH-VI-520]
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Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10(-4). These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.
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