Modeling truncated pixel values of faint reflections in MicroED images

Title
Modeling truncated pixel values of faint reflections in MicroED images
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 49, Issue 3, Pages 1029-1034
Publisher
International Union of Crystallography (IUCr)
Online
2016-05-12
DOI
10.1107/s1600576716007196

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