Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy

Published 2016 View Full Article

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Title
Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy
Authors
Keywords
-
Journal
2D Materials
Volume 3, Issue 3, Pages 034004
Publisher
IOP Publishing
Online
2016-08-12
DOI
10.1088/2053-1583/3/3/034004

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