4.5 Article

Transparent Electrodes in Silicon Heterojunction Solar Cells: Influence on Contact Passivation

Journal

IEEE JOURNAL OF PHOTOVOLTAICS
Volume 6, Issue 1, Pages 17-27

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPHOTOV.2015.2484962

Keywords

Amorphous silicon; charge carrier lifetime; crystalline silicon; heterojunctions; passivating contacts; photovoltaic cells; solar cells

Funding

  1. Axpo Naturstrom Fonds
  2. European Commission [608498]
  3. Office Federal de L'energie
  4. Fonds National Suisse Reequip program [206021_139135, 206021_133832]
  5. Department of Energy
  6. EuroTech Universities Alliance
  7. Swiss National Science Foundation (SNF) [206021_139135, 206021_133832] Funding Source: Swiss National Science Foundation (SNF)

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Charge carrier collection in silicon heterojunction solar cells occurs via intrinsic/doped hydrogenated amorphous silicon layer stacks deposited on the crystalline silicon wafer surfaces. Usually, both the electron and hole collecting stacks are externally capped by an n-type transparent conductive oxide, which is primarily needed for carrier extraction. Earlier, it has been demonstrated that the mere presence of such oxides can affect the carrier recombination in the crystalline silicon absorber. Here, we present a detailed investigation of the impact of this phenomenon on both the electron and hole collecting sides, including its consequences for the operating voltages of silicon heterojunction solar cells. Based on our findings, we define guiding principles for improved passivating contact design for high-efficiency silicon solar cells.

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