Implications of Accelerated Recombination-Active Defect Complex Formation for Mitigating Carrier-Induced Degradation in Silicon

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Title
Implications of Accelerated Recombination-Active Defect Complex Formation for Mitigating Carrier-Induced Degradation in Silicon
Authors
Keywords
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Journal
IEEE Journal of Photovoltaics
Volume 6, Issue 1, Pages 92-99
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-11-20
DOI
10.1109/jphotov.2015.2494691

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