Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices

Published 2016 View Full Article

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Title
Review—Carrier Lifetime Spectroscopy for Defect Characterization in Semiconductor Materials and Devices
Authors
Keywords
-
Journal
ECS Journal of Solid State Science and Technology
Volume 5, Issue 4, Pages P3108-P3137
Publisher
The Electrochemical Society
Online
2016-03-16
DOI
10.1149/2.0201604jss

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