Effects of instrument imperfections on quantitative scanning transmission electron microscopy

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Title
Effects of instrument imperfections on quantitative scanning transmission electron microscopy
Authors
Keywords
TEM, Quantitative STEM, ADF STEM, Detector, Artifacts, Diffraction distortion, Accidental electrons
Journal
ULTRAMICROSCOPY
Volume 161, Issue -, Pages 146-160
Publisher
Elsevier BV
Online
2015-11-04
DOI
10.1016/j.ultramic.2015.10.026

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