Sample tilt effects on atom column position determination in ABF–STEM imaging

Title
Sample tilt effects on atom column position determination in ABF–STEM imaging
Authors
Keywords
Annular bright-field imaging, Atom position determination, Sample tilt, Image simulation
Journal
ULTRAMICROSCOPY
Volume 160, Issue -, Pages 110-117
Publisher
Elsevier BV
Online
2015-10-23
DOI
10.1016/j.ultramic.2015.10.008

Ask authors/readers for more resources

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More