Characterization of vanadium oxide thin films with different stoichiometry using Raman spectroscopy

Title
Characterization of vanadium oxide thin films with different stoichiometry using Raman spectroscopy
Authors
Keywords
Raman spectroscopy, Vanadium oxide, Stoichiometry, Thin films
Journal
THIN SOLID FILMS
Volume 620, Issue -, Pages 64-69
Publisher
Elsevier BV
Online
2016-09-21
DOI
10.1016/j.tsf.2016.07.082

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