QTL mapping identifies a major locus for resistance in wheat to Sunn pest (Eurygaster integriceps) feeding at the vegetative growth stage
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Title
QTL mapping identifies a major locus for resistance in wheat to Sunn pest (Eurygaster integriceps) feeding at the vegetative growth stage
Authors
Keywords
Quantitative Trait Locus, Double Haploid, Composite Interval Mapping, Wheat Line, Synthetic Hexaploid Wheat
Journal
THEORETICAL AND APPLIED GENETICS
Volume 130, Issue 2, Pages 309-318
Publisher
Springer Nature
Online
2016-10-15
DOI
10.1007/s00122-016-2812-1
References
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