Studying saturation mobility, threshold voltage, and stability of PMMA-SiO 2 -TMSPM nano-hybrid as OFET gate dielectric

Published 2016 View Full Article

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Title
Studying saturation mobility, threshold voltage, and stability of PMMA-SiO 2 -TMSPM nano-hybrid as OFET gate dielectric
Authors
Keywords
Thin films, Coatings, Electron microscopy (SEM), Electrical properties
Journal
SYNTHETIC METALS
Volume 221, Issue -, Pages 332-339
Publisher
Elsevier BV
Online
2016-10-02
DOI
10.1016/j.synthmet.2016.09.007

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