4.5 Article

Analysis of high quality superconducting resonators: consequences for TLS properties in amorphous oxides

Journal

SUPERCONDUCTOR SCIENCE & TECHNOLOGY
Volume 29, Issue 4, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/0953-2048/29/4/044008

Keywords

two level systems; 1/f noise; superconducting device; superconducting resonator; dielectric loss

Funding

  1. NMS
  2. EPSRC [EP/J017329/1]
  3. ARO [W911NF-13-1-0431]
  4. EPSRC [EP/J017329/1] Funding Source: UKRI
  5. Engineering and Physical Sciences Research Council [EP/J017329/1] Funding Source: researchfish

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1/f noise caused by microscopic two-level systems (TLS) is known to be very detrimental to the performance of superconducting quantum devices but the nature of these TLS is still poorly understood. Recent experiments with superconducting resonators indicates that interaction between TLS in the oxide at the film-substrate interface is not negligible. Here we present data on the loss and 1/f frequency noise from two different Nb resonators with and without Pt capping and discuss what conclusions can be drawn regarding the properties of TLS in amorphous oxides. We also estimate the concentration and dipole moment of the TLS.

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