Journal
SOLID-STATE ELECTRONICS
Volume 123, Issue -, Pages 19-25Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.sse.2016.05.015
Keywords
GaN HEMT; Large-signal modeling; Thermal and trapping effects; Genetic optimization; Power amplifier design
Funding
- University of Sharjah, Sharjah, United Arab Emiratis
- University of Calgary, Calgary, Canada
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In this paper, an improved modeling approach has been developed and validated for GaN high electron mobility transistors (HEMTs). The proposed analytical model accurately simulates the drain current and its inherent trapping and thermal effects. Genetic-algorithm-based procedure is developed to automatically find the fitting parameters of the model. The developed modeling technique is implemented on a packaged GaN-on-Si HEMT and validated by DC and small-/large-signal RF measurements. The model is also employed for designing and realizing a switch-mode inverse class-F power amplifier. The amplifier simulations showed a very good agreement with RF large-signal measurements. (C) 2016 Elsevier Ltd. All rights reserved.
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