Impact of temperature and programming method on the data retention of Cu/Al 2 O 3 -based conductive-bridge RAM operated at low-current (10 μA)

Published 2016 View Full Article

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Title
Impact of temperature and programming method on the data retention of Cu/Al 2 O 3 -based conductive-bridge RAM operated at low-current (10 μA)
Authors
Keywords
RRAM, Conductive-bridging, CBRAM, PMC, Programming algorithm, Retention, Memory window
Journal
SOLID-STATE ELECTRONICS
Volume 125, Issue -, Pages 189-197
Publisher
Elsevier BV
Online
2016-07-22
DOI
10.1016/j.sse.2016.07.015

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