Resistive switching memories based on metal oxides: mechanisms, reliability and scaling

Published 2016 View Full Article

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Title
Resistive switching memories based on metal oxides: mechanisms, reliability and scaling
Authors
Keywords
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Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 31, Issue 6, Pages 063002
Publisher
IOP Publishing
Online
2016-05-16
DOI
10.1088/0268-1242/31/6/063002

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