A tandem time–of–flight spectrometer for negative–ion/positive–ion coincidence measurements with soft x-ray excitation

Title
A tandem time–of–flight spectrometer for negative–ion/positive–ion coincidence measurements with soft x-ray excitation
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 87, Issue 1, Pages 013109
Publisher
AIP Publishing
Online
2016-01-28
DOI
10.1063/1.4940425

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