Resolving hot spot microstructure using x-ray penumbral imaging (invited)

Title
Resolving hot spot microstructure using x-ray penumbral imaging (invited)
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 87, Issue 11, Pages 11E201
Publisher
AIP Publishing
Online
2016-08-06
DOI
10.1063/1.4959161

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