Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

Published 2016 View Full Article

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Title
Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
Authors
Keywords
Accelerated test, Brownian motion, Degradation test, Light-emitting diodes, Step stress, Wiener process
Journal
RELIABILITY ENGINEERING & SYSTEM SAFETY
Volume 154, Issue -, Pages 152-159
Publisher
Elsevier BV
Online
2016-06-08
DOI
10.1016/j.ress.2016.06.002

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