Journal
PROGRESS IN PHOTOVOLTAICS
Volume 24, Issue 9, Pages 1229-1236Publisher
WILEY-BLACKWELL
DOI: 10.1002/pip.2782
Keywords
X-ray photoelectron spectroscopy (XPS); interface; Cu2O; back contact; CdTe solar cell
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In this paper a promising solution for the notorious problem of manufacturing a stable low ohmic back contact of a CdTe thin film superstrate solar cell is presented without using elemental copper. Instead we have used a Cu2O layer inserted between the CdTe absorber and metal contact (Au). In contrast to the barrier free band alignment gained by using the transitivity rules, XPS measurements show a barrier in the valence band of the Cu2O layers directly after deposition, which results in a low performing JV curve. The contact can be improved by a short thermal treatment resulting in efficiencies superior to copper based contacts for standard CdS/CdTe hetero junction solar cells prepared on commercial glass/FTO substrates. By replacing the CdS window layer with a CdS:O buffer layer efficiencies of >15% could be achieved. Copyright (c) 2016 John Wiley & Sons, Ltd.
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