Modification on graphite due to helium ion irradiation

Authors

Keywords

Plasma focus, Helium ion, Graphite, Atomic force microscopy, Transmission electron microscopy, X-ray diffraction

Journal

PHYSICS LETTERS A

Volume 380, Issue 33, Pages 2525-2530

Publisher

Elsevier BV

Online

2016-05-28

DOI

10.1016/j.physleta.2016.05.044

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