Beyond accuracy: Learning selective Bayesian classifiers with minimal test cost

Title
Beyond accuracy: Learning selective Bayesian classifiers with minimal test cost
Authors
Keywords
Naive Bayes, Test-cost sensitive learning, Test cost, Classification accuracy, Greedy search
Journal
PATTERN RECOGNITION LETTERS
Volume 80, Issue -, Pages 165-171
Publisher
Elsevier BV
Online
2016-07-05
DOI
10.1016/j.patrec.2016.06.018

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