Contact-resistance effects in PDI8-CN 2 n-type thin-film transistors investigated by Kelvin-probe potentiometry

Title
Contact-resistance effects in PDI8-CN 2 n-type thin-film transistors investigated by Kelvin-probe potentiometry
Authors
Keywords
Organic , n, -type transistors, Perylene diimide molecules, Contact resistance effects, Kelvin Probe Microscopy
Journal
ORGANIC ELECTRONICS
Volume 28, Issue -, Pages 299-305
Publisher
Elsevier BV
Online
2015-11-22
DOI
10.1016/j.orgel.2015.11.009

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