Model-blind characterization of thin-film optical constants with momentum-resolved reflectometry

Title
Model-blind characterization of thin-film optical constants with momentum-resolved reflectometry
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 24, Issue 25, Pages 28842
Publisher
The Optical Society
Online
2016-12-06
DOI
10.1364/oe.24.028842

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started