Journal
OPTICS AND LASERS IN ENGINEERING
Volume 87, Issue -, Pages 83-89Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.optlaseng.2016.04.012
Keywords
Fringe projection; Fringe analysis; High dynamic range; 3D shape measurement
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Funding
- National Science Foundation (NSF) [CMMI-1523048]
- Directorate For Engineering
- Div Of Civil, Mechanical, & Manufact Inn [1523048] Funding Source: National Science Foundation
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This paper proposes a method to potentially conquer one of the challenges in the optical metrology community: optically measuring three-dimensional (3D) objects with high surface contrast. We discover that for digitally equally phase-shifted fringe patterns, if the fringe period P is art even number, the N = P/2 x k, (k=1, 2, 3, ...) step algorithm can accurately recover phase even if the fringe patterns are saturated; and if P is an odd number, N = P x k step algorithm can also accurately recover phase even if the fringe patterns are saturated. This finding leads to a novel method to optically measure shiny surfaces, where the saturation due to surface shininess could be substantially alleviated. Both simulations and experiments successfully verified the proposed method. (C) 2016 Elsevier Ltd. All rights reserved.
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