Quality assessment of speckle patterns for DIC by consideration of both systematic errors and random errors

Published 2016 View Full Article

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Title
Quality assessment of speckle patterns for DIC by consideration of both systematic errors and random errors
Authors
Keywords
Digital image correlation, Speckle pattern, Root mean square error, Interpolation bias, Noise-induced bias
Journal
OPTICS AND LASERS IN ENGINEERING
Volume 86, Issue -, Pages 132-142
Publisher
Elsevier BV
Online
2016-06-07
DOI
10.1016/j.optlaseng.2016.05.019

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