A Large Scale Characterization of Device Uptimes

Published 2023 View Full Article

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Title
A Large Scale Characterization of Device Uptimes
Authors
Keywords
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Journal
IEEE Transactions on Emerging Topics in Computing
Volume 11, Issue 3, Pages 553-565
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-05-04
DOI
10.1109/tetc.2023.3271315
References
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