HfO2/Al2O3multilayer for RRAM arrays: a technique to improve tail-bit retention

Published 2016 View Full Article

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Title
HfO2/Al2O3multilayer for RRAM arrays: a technique to improve tail-bit retention
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 27, Issue 39, Pages 395201
Publisher
IOP Publishing
Online
2016-08-18
DOI
10.1088/0957-4484/27/39/395201

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