QM/MM Methods for Crystalline Defects. Part 1: Locality of the Tight Binding Model

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Title
QM/MM Methods for Crystalline Defects. Part 1: Locality of the Tight Binding Model
Authors
Keywords
-
Journal
MULTISCALE MODELING & SIMULATION
Volume 14, Issue 1, Pages 232-264
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Online
2016-02-25
DOI
10.1137/15m1022628

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