Multiple instance learning-based two-stage metric learning network for whole slide image classification

Title
Multiple instance learning-based two-stage metric learning network for whole slide image classification
Authors
Keywords
-
Journal
VISUAL COMPUTER
Volume -, Issue -, Pages -
Publisher
Springer Science and Business Media LLC
Online
2023-11-02
DOI
10.1007/s00371-023-03131-2

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started