Sputtering and structural modifications induced in silicon dioxide (SiO2) thin films under (10–40 MeV) Auq+ heavy ion irradiation
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Title
Sputtering and structural modifications induced in silicon dioxide (SiO2) thin films under (10–40 MeV) Auq+ heavy ion irradiation
Authors
Keywords
-
Journal
SURFACE AND INTERFACE ANALYSIS
Volume -, Issue -, Pages -
Publisher
Wiley
Online
2023-09-19
DOI
10.1002/sia.7257
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