Experimental Study of Electrical Breakdown in MEMS/NEMS Devices With Deep Submicron Gaps

Title
Experimental Study of Electrical Breakdown in MEMS/NEMS Devices With Deep Submicron Gaps
Authors
Keywords
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Journal
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Volume 32, Issue 5, Pages 413-415
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2023-08-09
DOI
10.1109/jmems.2023.3299559

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