Deep learning-based conductive particle inspection for TFT-LCDs inspired by parametric space envelope

Title
Deep learning-based conductive particle inspection for TFT-LCDs inspired by parametric space envelope
Authors
Keywords
-
Journal
JOURNAL OF INTELLIGENT MANUFACTURING
Volume -, Issue -, Pages -
Publisher
Springer Science and Business Media LLC
Online
2023-10-30
DOI
10.1007/s10845-023-02241-x

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started