Applying fully convolutional networks for beam profile and emittance measurements
Published 2023 View Full Article
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Title
Applying fully convolutional networks for beam profile and emittance measurements
Authors
Keywords
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Journal
Journal of Instrumentation
Volume 18, Issue 10, Pages P10039
Publisher
IOP Publishing
Online
2023-10-31
DOI
10.1088/1748-0221/18/10/p10039
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