Leakage current induced erratic switching in Si avalanche bipolar junction transistors under overvoltage states

Title
Leakage current induced erratic switching in Si avalanche bipolar junction transistors under overvoltage states
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 134, Issue 17, Pages -
Publisher
AIP Publishing
Online
2023-11-03
DOI
10.1063/5.0169866

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started