4.4 Article

Fabrication of a W/CuxO/Cu memristor with sub-micron holes for passive sensing of oxygen

Journal

MICROELECTRONIC ENGINEERING
Volume 164, Issue -, Pages 48-52

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.mee.2016.07.005

Keywords

Memristor; Passive gas sensor; Oxygen; Copper oxide; Resistive switching

Funding

  1. Alfred P. Sloan Foundation M.PhD Program
  2. NSF [IIS-1054585]
  3. Direct For Computer & Info Scie & Enginr
  4. Div Of Information & Intelligent Systems [1054585] Funding Source: National Science Foundation

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Memristive devices were fabricated and investigated for passive sensing of oxygen. The device design involved deposition of Cu bottom electrodes, oxygen-deficient copper oxide (CuxO) switching layers, and W top electrodes in a crossbar array structure. Two groups of holes that were 300 nm and 700 nm in diameter were etched in the top W electrodes to reveal the oxide surface. The devices were subjected to ambient air at 180 degrees C to induce sensing in minutes. Measurements of atomic composition, which were determined via energy-dispersive X-ray spectroscopy (EDS), show an increase in oxygen atoms in the layer after exposure to ambient air. For the 300-nm holes, low and high resistance states demonstrated increased values (up to 25.0% and 74.8%, respectively) upon exposure to ambient air at 180 degrees C. The larger 700-nm holes became capacitor-like after exposure. This work demonstrates a step towards the use of the memristor as a passive gas sensor, which we have named memsensors, by taking advantage of the device's ability to memorize (or record) historical information. (C) 2016 Elsevier B.V. All rights reserved.

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