Inductively coupled plasma optical emission spectrometry as a reference method for silicon estimation by near infrared spectroscopy and potential application to global-scale studies of plant chemistry

Published 2016 View Full Article

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Title
Inductively coupled plasma optical emission spectrometry as a reference method for silicon estimation by near infrared spectroscopy and potential application to global-scale studies of plant chemistry
Authors
Keywords
Plant silicon, Strong base digestion, ICP OES, Near infrared spectroscopy, Modeling, Partial least squares regression
Journal
MICROCHEMICAL JOURNAL
Volume 129, Issue -, Pages 231-235
Publisher
Elsevier BV
Online
2016-06-30
DOI
10.1016/j.microc.2016.06.028

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